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IEC 62368 Test Probes Kits for Accessible Parts BND-TPK08

Product ID: BND-TPK08
Origin: China
Status: In stock
Product description:BOAND provides all kinds of test probe kits are available for specific standards..Probe Kits offer substantial cost savings not to mention added convenience.
Accessibility probe kits can be created for other standards on request.
The BND-TPK-08 contains the devices listed in the core of the IEC62368. It is with test probes for determination of accessible parts.


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Product Introduction

BND-TPK08 test probe kits include the following:

·Figure V.1 – Jointed test probe for equipment likely to be accessible to children (BND-UL100)*1

·Figure V.2 – Jointed test probe for equipment not likely to be accessible to children (BND-BF50)*1

·Figure V.3 – Blunt probe (BND-TB12)

·Figure V.4 – Wedge probe (BND-X102)

·Figure V.5 – Terminal probe (BND-CF)



Product Specification 

An accessible part of an equipment is a part that can be touched by a body part. For the  purposes of determining an accessible part, a body part is represented by one or more of the  specified probes.


Test method 1 – Surfaces and openings tested with jointed test probes

For surfaces and openings, the following jointed test probe is applied, without appreciable  force and in any possible position, to the surfaces and openings of the equipment: 

− the test probe of Figure V.1

− the test probe of Figure V.2 


Test method 2 – Openings tested with straight unjointed test probes

Openings preventing access to a part by the jointed test probe are further tested by means of  a straight unjointed version of the respective test probe applied with a force of 30 N. If the  unjointed probe enters the openings, test method 1 is repeated, except that the appropriate  jointed version of the test probe is pushed through the opening using any necessary force up  to 30 N.


Test method 3 – Plugs, jacks, connectors  

For a plug, jack, or connector, the blunt probe of Figure V.3 is applied without appreciable  force and in any possible position to the plug, jack, or connector.



Test method 4 – Slot openings  

For slot openings exceeding 50 mm, the wedge probe of Figure V.4 is applied with a force of  30 N to the openings of the equipment. This requirement also applies where entry behind a  door, panel, removable cover, etc. is possible without the use of a tool.


Test method 5 – Terminals intended to be used by an ordinary person  

Each terminal is tested with the straight test probe of Figure V.5 with a force of 1 N ± 0,1 N  and with the length limited to 20 mm ± 0,2 mm.


Accessible part criterion 

 If a part can be touched by the specified probe, then the part is accessible.









Product Images 


IEC62368 TPK08.jpg








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